검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Degradation of 4H-SiC IGBT threshold characteristics due to SiC/SiO2 interface defects Pesic I, Navarro D, Miyake M, Miura-Mattausch M Solid-State Electronics, 101, 126, 2014 |
| No. | Article |
|---|---|
| 1 |
Degradation of 4H-SiC IGBT threshold characteristics due to SiC/SiO2 interface defects Pesic I, Navarro D, Miyake M, Miura-Mattausch M Solid-State Electronics, 101, 126, 2014 |