화학공학소재연구정보센터
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No. Article
1 In-situ Ga doping of fully strained Ge1-xSnx heteroepitaxial layers grown on Ge(001) substrates
Shimura Y, Takeuchi S, Nakatsuka O, Vincent B, Gencarelli F, Clarysse T, Vandervorst W, Caymax M, Loo R, Jensen A, Petersen DH, Zaima S
Thin Solid Films, 520(8), 3206, 2012
2 Ultra Shallow Arsenic Junctions in Germanium Formed by Millisecond Laser Annealing
Hellings G, Rosseel E, Simoen E, Radisic D, Petersen DH, Hansen O, Nielsen PF, Zschatzsch G, Nazir A, Clarysse T, Vandervorst W, Hoffmann TY, De Meyer K
Electrochemical and Solid State Letters, 14(1), II39, 2011
3 Study of submelt laser induced junction nonuniformities using Therma-Probe
Rosseel E, Bogdanowicz J, Clarysse T, Vandervorst W, Ortolland C, Hoffmann T, Salnik A, Nicolaides L, Han SH, Petersen DH, Lin R, Hansen O
Journal of Vacuum Science & Technology B, 28(1), C1C21, 2010
4 Review of electrical characterization of ultra-shallow junctions with micro four-point probes
Petersen DH, Hansen O, Hansen TM, Boggild P, Lin R, Kjaer D, Nielsen PF, Clarysse T, Vandervorst W, Rosseel E, Bennett NS, Cowern NEB
Journal of Vacuum Science & Technology B, 28(1), C1C27, 2010
5 Sensitivity study of micro four-point probe measurements on small samples
Wang F, Petersen DH, Hansen TM, Henriksen TR, Boggild P, Hansen O
Journal of Vacuum Science & Technology B, 28(1), C1C34, 2010
6 Electrical characterization of InGaAs ultra-shallow junctions
Petersen DH, Hansen O, Boggild P, Lin R, Nielsen PF, Lin D, Adelmann C, Alian A, Merckling C, Penaud J, Brammertz G, Goossens J, Vandervorst W, Clarysse T
Journal of Vacuum Science & Technology B, 28(1), C1C41, 2010
7 Advanced carrier depth profiling on Si and Ge with micro four-point probe
Clarysse T, Eyben P, Parmentier B, Van Daele B, Satta A, Vandervorst W, Lin R, Petersen DH, Nielsen PF
Journal of Vacuum Science & Technology B, 26(1), 317, 2008
8 Comparative study of size dependent four-point probe sheet resistance measurement on laser annealed ultra-shallow junctions
Petersen DH, Lin R, Hansen TM, Rosseel E, Vandervorst W, Markvardsen C, Kjaer D, Nielsen PF
Journal of Vacuum Science & Technology B, 26(1), 362, 2008
9 Study of the roughness in a photoresist masked, isotropic, SF6-based ICP silicon etch
Larsen KP, Petersen DH, Hansen O
Journal of the Electrochemical Society, 153(12), G1051, 2006
10 Wafer-scale fabrication of polymer distributed feedback lasers
Christiansen MB, Scholer M, Balslev S, Nielsen RB, Petersen DH, Kristensen A
Journal of Vacuum Science & Technology B, 24(6), 3252, 2006