검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Multi-resolution correlative focused ion beam scanning electron microscopy: Applications to cell biology Narayan K, Danielson CM, Lagarec K, Lowekamp BC, Coffman P, Laquerre A, Phaneuf MW, Hope TJ, Subramaniam S Journal of Structural Biology, 185(3), 278, 2014 |
| 2 |
Use of the focused ion beam to locate failure sites within electrically erasable read only memory microcircuits Haythornthwaite R, Nxumalo J, Phaneuf MW Journal of Vacuum Science & Technology A, 22(3), 902, 2004 |
| 3 |
Focused ion beam and transmission electron microscopy method for root cause analysis of InP ridge laser devices Griswold EM, Sharma U, Phaneuf MW Journal of Vacuum Science & Technology A, 22(3), 930, 2004 |