검색결과 : 3건
No. | Article |
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1 |
Origin of the dry etch damage in the short-channel oxide thin-film transistors for high resolution display application Choi JH, Yang JH, Pi JE, Hwang CY, Kim HO, Hwang CS Thin Solid Films, 674, 71, 2019 |
2 |
Effects of thickness and geometric variations in the oxide gate stack on the nonvolatile memory behaviors of charge-trap memory thin-film transistors Bak JY, Kim SJ, Byun CW, Pi JE, Ryu MK, Hwang CS, Yoon SM Solid-State Electronics, 111, 153, 2015 |
3 |
A simple shift register circuit for depletion-mode oxide TFTs Pi JE, Ryu MK, Hwang CS, Park SHK, Yoon SM, Lym H, Kim Y, Oh H, Park K Solid-State Electronics, 79, 2, 2013 |