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| No. | Article |
|---|---|
| 1 |
Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy Ramdani J, Droopad R, Yu Z, Curless JA, Overgaard CD, Finder J, Eisenbeiser K, Hallmark JA, Ooms WJ, Kaushik V, Alluri P, Pietambaram S Applied Surface Science, 159, 127, 2000 |