| 1 |
Distinct ferroelectric domain switching dynamics in epitaxial BiFeO3 (001) capacitors depending on the bias polarity
Lim SY, Park MS, Wi S, Chung JS, Yang SM
Current Applied Physics, 20(10), 1185, 2020 |
| 2 |
Strong impact of LiNbO3 fillers on local electromechanical and electrochemical properties of P(VDF-TrFe) polymer disclosed via scanning probe microscopy
Ivanov MS, Silibin MV, Khomchenko VA, Nikitin T, Kalinin AS, Karpinsky DV, Bdikin I, Polyakov VV, Fausto R, Paixao JA
Applied Surface Science, 470, 1093, 2019 |
| 3 |
Superdomain structure and high conductivity at the vertices in the (111)-oriented epitaxial tetragonal Pb(Zr,Ti)O-3 thin film
Yang SM, Shin YJ, Ehara Y, Funakubo H, Yoon JG, Scott JF, Noh TW
Current Applied Physics, 19(4), 418, 2019 |
| 4 |
Structure and piezoelectric properties of Sm-doped BiFeO3 ceramics near the morphotropic phase boundary
Karpinsky DV, Troyanchuk IO, Trukhanov AV, Willinger M, Khomchenko VA, Kholkin AL, Sikolenko V, Maniecki T, Maniukiewicz W, Dubkov SV, Silibin MV
Materials Research Bulletin, 112, 420, 2019 |
| 5 |
Microscopic study of polydopamine modified BaTiO3/poly(vinylidene fluoride-trifluoroethylene) nanocomposite films
Guo HY, Liu N, Liu X, Hong S
Thin Solid Films, 682, 121, 2019 |
| 6 |
Diminish electrostatic in piezoresponse force microscopy through longer or ultra-stiff tips
Gomez A, Puig T, Obradors X
Applied Surface Science, 439, 577, 2018 |
| 7 |
The effect of annealing temperature on the morphology and piezoelectric characteristics of BaTiO3 nanofibers and domain switching under different temperatures
Zhu Z, Zhu WM
Current Applied Physics, 18(8), 886, 2018 |
| 8 |
The effect of annealing temperature on the morphology and piezoelectric characteristics of BaTiO3 nanofibers and domain switching under different temperatures
Zhu Z, Zhu WM
Current Applied Physics, 18(8), 886, 2018 |
| 9 |
Investigation of defects dependence of local piezoelectric response on Fe, La-modified (Pb,Sr)TiO3 thin films: A piezoresponse force microscopy study
Bastos WB, Longo E, Chiquito AJ, Pontes DSL, Pontes FM
Materials Chemistry and Physics, 214, 180, 2018 |
| 10 |
Growth assessment and scrutinize dielectric reliability of c-axis oriented insulating AlN thin films in MIM structures for microelectronics applications
Pawar S, Singh K, Sharma S, Pandey A, Dutta S, Kaura D
Materials Chemistry and Physics, 219, 74, 2018 |
