검색결과 : 8건
No. | Article |
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1 |
Structural, magnetic, optical, and magneto-optical properties of CoFe2O4 thin films fabricated by a chemical approach Illa R, Jesko R, Silber R, Zivotsky O, Kutlakova KM, Matejova L, Kolencik M, Pistora J, Hamrle J Materials Research Bulletin, 117, 96, 2019 |
2 |
In-situ Mueller matrix ellipsometry of silicon nanowires grown by plasma-enhanced vapor-liquid-solid method for radial junction solar cells Mrazkova Z, Foldyna M, Misra S, Al-Ghzaiwat M, Postava K, Pistora J, Cabarrocas PRI Applied Surface Science, 421, 667, 2017 |
3 |
In-situ spectroscopic ellipsometry of microcrystalline silicon deposited by plasma-enhanced chemical vapor deposition on flexible Fe-Ni alloy substrate for photovoltaic applications Mrazkova Z, Torres-Rios A, Ruggeri R, Foldyna M, Postava K, Pistora J, i Cabarrocas PR Thin Solid Films, 571, 749, 2014 |
4 |
Selective sensitivity of ellipsometry to magnetic nanostructures Postava K, Hrabovsky D, Hamrlova J, Pistora J, Wawro A, Baczewski LT, Sveklo I, Maziewski A Thin Solid Films, 519(9), 2627, 2011 |
5 |
Depth-sensitive characterization of surface magnetic properties of as-quenched FeNbB ribbons Zivotsky O, Postava K, Hrabovska K, Hendrych A, Pistora J, Kraus L Applied Surface Science, 255(5), 3322, 2008 |
6 |
Spectroscopic ellipsometry on lamellar gratings Antos R, Ohlidal I, Mistrik J, Murakami K, Yamaguchi T, Pistora J, Horie M, Visnovsky S Applied Surface Science, 244(1-4), 225, 2005 |
7 |
Magneto-optical ellipsometry of systems containing thick layers Postava K, Zivotsky O, Pistora J, Yamaguchi I Thin Solid Films, 455-56, 615, 2004 |
8 |
The short detector for magnetic testing Pistora J, Lesnak M, Janik M, Foukal J Materials Science Forum, 373-3, 465, 2001 |