검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Gate leakage properties in (Al(2)O(3)/HfO(2)/Al(2)O(3)) dielectric of MOS devices Nasrallah SAB, Bouazra A, Poncet A, Said M Thin Solid Films, 517(1), 456, 2008 |
| 2 |
Electronic properties of Ge nanocrystals for non volatile memory applications Kanoun M, Busseret C, Poncet A, Souifi A, Baron T, Gautier E Solid-State Electronics, 50(7-8), 1310, 2006 |
| 3 |
Ground and first excited states observed in silicon nanocrystals by photocurrent technique De la Torre J, Souifi A, Poncet A, Bremond G, Guillot G, Garrido B, Morante JR Solid-State Electronics, 49(7), 1112, 2005 |