검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Investigation of polycrystalline nickel silicide films as a gate material Qin M, Poon VMC, Ho SCH Journal of the Electrochemical Society, 148(5), G271, 2001 |
| 2 |
Characterization of MOSFETs fabricated on large-grain polysilicon on insulator Jagar S, Chan MS, Wang HM, Poon VMC, Myasnikov AM Solid-State Electronics, 45(5), 743, 2001 |
| 3 |
Young's modulus measurement of nickel silicide film on crystal silicon by a surface profiler Qin M, Poon VMC Journal of Materials Science Letters, 19(24), 2243, 2000 |