검색결과 : 2건
No. | Article |
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1 |
Optical metrology of thick photoresist process for advanced 3D applications Nolot E, Andre A, Scibetta C, Poulingue M, Levin L, Vignoud L, Issele H Thin Solid Films, 571, 609, 2014 |
2 |
The effects of particle pollution on the mechanical behaviour of multilayered systems Poulingue M, Ignat M, Dijon J Thin Solid Films, 348(1-2), 215, 1999 |