검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Ion sputtering rates of W-, Ti- and Cr-carbides studied at different Ar+ ion incidence angles Zalar A, Kovac J, Pracek B, Panjan P, Ceh M Applied Surface Science, 254(20), 6611, 2008 |
| 2 |
Characterization of iron oxide layers using Auger electron spectroscopy Bizjak M, Zalar A, Panjan P, Zorko B, Pracek B Applied Surface Science, 253(8), 3977, 2007 |
| 3 |
Auger electron spectroscopy depth profiling of Fe-oxide layers on electromagnetic sheets prepared by low temperature oxidation Kovac J, Bizjak M, Pracek B, Zalar A Applied Surface Science, 253(9), 4132, 2007 |
| 4 |
AES depth profiling and interface analysis of C/Ta bilayers Zalar A, Kovac J, Pracek B, Hofmann S, Panjan P Applied Surface Science, 252(5), 2056, 2005 |
| 5 |
Quantification of AES depth profiles by the MRI model Kovac J, Zalar A, Pracek B Applied Surface Science, 207(1-4), 128, 2003 |
| 6 |
The changes of short range ordering in amorphous silicon-carbon alloys by thermal annealing Gracin D, Radic N, Ivanda M, Andreic Z, Pracek B Thin Solid Films, 317(1-2), 206, 1998 |
| 7 |
Thin cathodoluminescent films deposited by sol-gel process Meznar LZ, Pracek B, Orel B, Bukovec P Thin Solid Films, 317(1-2), 336, 1998 |
| 8 |
FTIR Spectroscopy and AES Study of Water Containment in SiO2 Thin-Films Demsar A, Colaric B, Rus S, Lindav J, Svegelj F, Orel B, Pracek B, Zalar A Thin Solid Films, 281-282, 409, 1996 |