검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Analysis and modeling of wafer-level process variability in 28 nm FD-SOI using split C-V measurements Pradeep K, Poiroux T, Scheer P, Juge A, Gouget G, Ghibaudo G Solid-State Electronics, 145, 19, 2018 |
| 2 |
Formation and Oxidation/Gasification of Carbonaceous Deposits: A Review Mahamulkar Shilpa, Yin Kehua, Agrawal Pradeep K., Davis Robert J., Jones Christopher W., Malek Andrzej, Shibata Hirokazu Industrial & Engineering Chemistry Research, 55(37), 9760, 2016 |