검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab Wiesmann J, Graf J, Hoffmann C, Hembd A, Michaelsen C, Yang N, Cordes H, He B, Preckwinkel U, Erlacher K Particle & Particle Systems Characterization, 26(3), 112, 2009 |
| 2 |
Stress and texture analysis with two-dimensional x-ray diffraction He BB, Preckwinkel U, Smith KL Materials Science Forum, 404-7, 109, 2002 |
| 3 |
Micro-area residual stress measurement using a two-dimensional detector He BB, Smith K, Preckwinkel U, Schultz W Materials Science Forum, 347-3, 101, 2000 |
| 4 |
Gage R&R study on residual stress measurement system with area detector He BPB, Smith K, Preckwinkel U, Schultz W Materials Science Forum, 347-3, 166, 2000 |