검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Analyzing optical properties of thin vanadium oxide films through semiconductor-to-metal phase transition using spectroscopic ellipsometry Sun JN, Pribil GK Applied Surface Science, 421, 819, 2017 |
| 2 |
Intrinsic Optical Properties and Enhanced Plasmonic Response of Epitaxial Silver Wu YW, Zhang CD, Estakhri NM, Zhao Y, Kim J, Zhang M, Liu XX, Pribil GK, Alu A, Shih CK, Li XQ Advanced Materials, 26(35), 6106, 2014 |
| 3 |
Fluid refractive index measurements using rough surface and prism minimum deviation techniques Synowicki RA, Pribil GK, Cooney G, Herzinger CM, Green SE, French RH, Yang MK, Burnett JH, Kaplan S Journal of Vacuum Science & Technology B, 22(6), 3450, 2004 |
| 4 |
Dielectric function of thin metal films by combined in situ transmission ellipsometry and intensity measurements Pribil GK, Johs B, Ianno NJ Thin Solid Films, 455-56, 443, 2004 |
| 5 |
Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared Hilfiker JN, Bungay CL, Synowicki RA, Tiwald TE, Herzinger CM, Johs B, Pribil GK, Woollam JA Journal of Vacuum Science & Technology A, 21(4), 1103, 2003 |