화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 An atomic force microscope tip designed to measure time-varying nanomechanical forces
Sahin O, Magonov S, Su C, Quate CF, Solgaard O
Nature Nanotechnology, 2(8), 507, 2007
2 A new scanning probe lithography scheme with a novel metal resist
Rolandi M, Quate CF, Dai HJ
Advanced Materials, 14(3), 191, 2002
3 Surface characterization and electrochemical properties of alkyl, fluorinated alkyl, and alkoxy monolayers on silicon
Barrelet CJ, Robinson DB, Cheng J, Hunt TP, Quate CF, Chidsey CED
Langmuir, 17(11), 3460, 2001
4 Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process
Gotoh Y, Matsumoto K, Maeda T, Cooper EB, Manalis SR, Fang H, Minne SC, Hunt T, Dai H, Harris J, Quate CF
Journal of Vacuum Science & Technology A, 18(4), 1321, 2000
5 Dendrimer-based self-assembled monolayers as resists for scanning probe lithography
Tully DC, Wilder K, Frechet JMJ, Trimble AR, Quate CF
Advanced Materials, 11(4), 314, 1999
6 Scanning probe lithography using a cantilever with integrated transistor for on-chip control of the exposing current
Wilder K, Quate CF
Journal of Vacuum Science & Technology B, 17(6), 3256, 1999
7 Electron beam and scanning probe lithography: A comparison
Wilder K, Quate CF, Singh B, Kyser DF
Journal of Vacuum Science & Technology B, 16(6), 3864, 1998
8 Synthesis of individual single-walled carbon nanotubes on patterned silicon wafers
Kong J, Soh HT, Cassell AM, Quate CF, Dai HJ
Nature, 395(6705), 878, 1998
9 Hybrid Atomic-Force Scanning Tunneling Lithography
Wilder K, Soh HT, Atalar A, Quate CF
Journal of Vacuum Science & Technology B, 15(5), 1811, 1997
10 Independent Parallel Lithography Using the Atomic-Force Microscope
Minne SC, Manalis SR, Atalar A, Quate CF
Journal of Vacuum Science & Technology B, 14(4), 2456, 1996