검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Gate oxide properties investigated by TOF-SIMS profiles on CMOS devices Zanderigo F, Brazzelli D, Rocca S, Pregnolato A, Grossi A, Queirolo G Applied Surface Science, 203, 437, 2003 |
| 2 |
Influence of roughness and grain dimension on the optical functions of polycrystalline silicon films Borghesi A, Tallarida G, Amore G, Cazzaniga F, Queirolo G, Alessandri M, Sassella A Thin Solid Films, 313-314, 243, 1998 |