검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Inter laboratory Study (vol 119, pg 10784, 2015) Shard AG, Havelund R, Spencer SJ, Gilmore IS, Alexander MR, Angerer TB, Aoyagi S, Barnes JP, Benayad A, Bernasik A, Ceccone G, Counsell JDP, Deeks C, Fletcher JS, Graham DJ, Heuser C, Lee TG, Marie C, Marzec MM, Mishra G, Rading D, Renault O, Scurr DJ, Shon HK, Spampinato V, Tian H, Wang FY, Winograd N, Wu K, Wucher A, Zhou YF, Zhu ZH, Cristaudo V, Poleunis C Journal of Physical Chemistry B, 119(44), 14337, 2015 |
| 2 |
Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study Shard AG, Havelund R, Spencer SJ, Gilmore IS, Alexander MR, Angerer TB, Aoyagi S, Barnes JP, Benayad A, Bernasik A, Ceccone G, Counsell JDP, Deeks C, Fletcher JS, Graham DJ, Heuser C, Lee TG, Marie C, Marzec MM, Mishra G, Rading D, Renault O, Scurr DJ, Shon HK, Spampinato V, Tian H, Wang FY, Winograd N, Wu K, Wucher A, Zhou YF, Zhu ZH Journal of Physical Chemistry B, 119(33), 10784, 2015 |
| 3 |
Sample Cooling or Rotation Improves C-60 Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study Sjovall P, Rading D, Ray S, Yang L, Shard AG Journal of Physical Chemistry B, 114(2), 769, 2010 |
| 4 |
Depth profiling of organic materials using improved ion beam conditions Cramer HG, Grehl T, Kollmer F, Moellers R, Niehuis E, Rading D Applied Surface Science, 255(4), 966, 2008 |
| 5 |
Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitations Grehl T, Mollers R, Niehuis E, Rading D Applied Surface Science, 255(4), 1404, 2008 |
| 6 |
Antioxidant segregation and crystallisation at polyester surfaces studied by ToF-SIMS Medard N, Benninghoven A, Rading D, Licciardello A, Auditore A, Duc TM, Montigaud H, Vernerey F, Poleunis C, Bertrand P Applied Surface Science, 203, 571, 2003 |
| 7 |
Secondary ion emission from molecular overlayers: Thiols on gold Rading D, Kersting R, Benninghoven A Journal of Vacuum Science & Technology A, 18(2), 312, 2000 |
| 8 |
Investigation of electron induced damaging of molecular overlayers by imaging static secondary ion mass spectroscopy Rading D, Liebing V, Becker G, Fuchs H, Benninghoven A Journal of Vacuum Science & Technology A, 16(6), 3449, 1998 |
| 9 |
STATIC SIMS INVESTIGATION OF IMMOBILIZED MOLECULES ON POLYMER SURFACES LEUTE A, RADING D, BENNINGHOVEN A, SCHROEDER K, KLEE D Advanced Materials, 6(10), 775, 1994 |