검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors Kwon SK, Kwon HM, Choi WI, Song HS, Lee HD Solid-State Electronics, 119, 29, 2016 |
| 2 |
Traps centers impact on Silicon nanocrystal memories given by Random Telegraph Signal and low frequency noise Trabelsi M, Militaru L, Sghaier N, Souifi A, Yacoubi N Solid-State Electronics, 56(1), 1, 2011 |
| 3 |
Noise in boron doped amorphous/microcrystallization silicon films Li SB, Wu ZM, Jiang YD, Li W, Liao NM, Yu JS Applied Surface Science, 254(11), 3274, 2008 |