검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Conduction and Charge-Trapping Characteristics of MOS Capacitors with Oxidized Nitride Films of Different Nitride Thicknesses Under Positive Stress Bias Mazumder MK, Kobayashi K, Ogata T, Mitsuhashi J, Mashiko Y, Koyama H Journal of the Electrochemical Society, 143(1), 368, 1996 |