검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Read margin analysis of crossbar arrays using the cell-variability-aware simulation method Sun W, Choi S, Shin H Solid-State Electronics, 140, 55, 2018 |
| 2 |
Flex-pass-gate SRAM for static noise margin enhancement using FinFET-based technology O'uchi SI, Endo K, Masahara M, Sakamoto K, Liu Y, Matsukawa T, Sekigawa T, Koike H, Suzuki E Solid-State Electronics, 52(11), 1694, 2008 |