검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Nanoscale CMOSFET performance improvement and reliability study for local strain techniques Huang HL, Chen JK, Houng MP Solid-State Electronics, 79, 31, 2013 |
| No. | Article |
|---|---|
| 1 |
Nanoscale CMOSFET performance improvement and reliability study for local strain techniques Huang HL, Chen JK, Houng MP Solid-State Electronics, 79, 31, 2013 |