검색결과 : 2건
No. | Article |
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1 |
Non-destructive optical depth profiling and real-time evaluation of spectroscopic data Fried M, Redei L Thin Solid Films, 364(1-2), 64, 2000 |
2 |
A modified learning strategy for neural networks to support spectroscopic ellipsometric data evaluation Redei L, Fried M, Barsony I, Wallinga H Thin Solid Films, 313-314, 149, 1998 |