검색결과 : 2건
No. | Article |
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1 |
Ellipsometric characterisation of heterogeneous 2D layers Wormeester H, Kooij ES, Mewe A, Rekveld S, Poelsema B Thin Solid Films, 455-56, 323, 2004 |
2 |
Characterization of an ultrasonic system using wavelet transforms Moholkar VS, Huitema M, Rekveld S, Warmoeskerken MMCG Chemical Engineering Science, 57(4), 617, 2002 |