검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Simulation study of interface traps and bulk traps in n(++)GaN/InAlN/AlN/GaN high electron mobility transistors Molnar M, Donoval D, Kuzmik J, Marek J, Chvala A, Pribytny P, Mikolasek M, Rendek K, Palankovski V Applied Surface Science, 312, 157, 2014 |