| 1 |
Influence of magnetron sputtering deposition conditions and thermal treatment on properties of platinum thin films for positive electrode-electrolyte-negative electrode structure
Sakaliuniene J, Abakeviciene B, Slapikas K, Tamulevicius S
Thin Solid Films, 594, 101, 2015 |
| 2 |
X-ray diffraction stress analysis of interrupted titanium nitride films: Combining the sin(2)psi and crystallite group methods
Sinkovits T, Zhao Y, O'Brien R, Dowey S
Thin Solid Films, 562, 206, 2014 |
| 3 |
Residual stress depth profiling in complex hard coating systems by X-ray diffraction
Klaus M, Genzel C, Holzschuh H
Thin Solid Films, 517(3), 1172, 2008 |
| 4 |
Mechanical stress gradients in thin films analyzed employing X-ray diffraction measurements at constant penetration/information depths
Wohlschlogel M, Baumann W, Welzel U, Mittemeijer EJ
Materials Science Forum, 524-525, 19, 2006 |
| 5 |
Determination of real space residual stress distributions sigma(ij) (z) of surface treated materials with diffraction methods Part II: Energy dispersive approach
Denks IA, Klaus M, Genzel C
Materials Science Forum, 524-525, 37, 2006 |
| 6 |
New type of X-ray diffractometer with cooperating robots for residual stress analysis on large components
Hessert R, Satzger W, Haase A, Schafmeister A
Materials Science Forum, 524-525, 749, 2006 |
| 7 |
Analysis of residual stresses and distortions in brazed joints of cemented carbide and steel
Ottlik A, Schulze V, Pintschovius L, Muller H, Lohe D
Materials Science Forum, 490-491, 491, 2005 |
| 8 |
The influence of surface roughness on the refraction correction of Bragg peak positions
Ott MH, Lohe D
Materials Science Forum, 404-7, 25, 2002 |
| 9 |
Advantageous use of glass capillaries as primary optics for x-ray residual stress analyses and a novel concept for "micro diffraction" stress analysis
Eigenmann B, Langhoff N, Bjeoumikhov A, Haase A, Stabenow R
Materials Science Forum, 404-7, 303, 2002 |
| 10 |
Investigation of the residual stresses and mechanical properties of (Cr,Al)N arc PVD coatings used for semi-solid metal (SSM) forming dies
Lugscheider E, Bobzin K, Hornig T, Maes A
Thin Solid Films, 420-421, 318, 2002 |
