검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Modified strain and elastic energy behavior of Ge islands formed on high-miscut Si(001) substrates Marcal LAB, Richard MI, Persichetti L, Favre-Nicolin V, Renevier H, Fanfoni M, Sgarlata A, Schulli TU, Malachias A Applied Surface Science, 466, 801, 2019 |
| 2 |
X-ray nanodiffraction in forward scattering and Bragg geometry of a single isolated Ag-Au nanowire Fernandez S, Richard MI, Floettoto D, Richter G, Mandula O, Aizarna ME, Favre-Nicolin V, Burghammer M, Schtilli T, Thomas O Thin Solid Films, 617, 9, 2016 |
| 3 |
Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements Ouled-Khachroum T, Richard MI, Noe P, Guichet C, Mocuta C, Sabbione C, Hippert F, Thomas O Thin Solid Films, 617, 44, 2016 |
| 4 |
Exploring Pd-Si(001) and Pd-Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements Richard MI, Fouet J, Guichet C, Mocuta C, Thomas O Thin Solid Films, 530, 100, 2013 |
| 5 |
In situ coherent X-ray diffraction of isolated core-shell nanowires Haag ST, Richard MI, Favre-Nicolin V, Welzel U, Jeurgens LPH, Ravy S, Richter G, Mittemeijer EJ, Thomas O Thin Solid Films, 530, 113, 2013 |
| 6 |
Strain inhomogeneity in copper islands probed by coherent X-ray diffraction Beutier G, Verdier M, Parry G, Gilles B, Labat S, Richard MI, Cornelius T, Lory PF, Hoang SV, Livet F, Thomas O, de Boissieu M Thin Solid Films, 530, 120, 2013 |
| 7 |
Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in situ GISAXS and GIXD study Richard MI, Schulli TU, Wintersberger E, Renaud G, Bauer G Thin Solid Films, 508(1-2), 213, 2006 |