검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion Gu C, Pivovarov A, Garcia R, Stevie F, Griffis D, Moran J, Kulig L, Richards JF Journal of Vacuum Science & Technology B, 22(1), 350, 2004 |
| 2 |
Carrier profiling via scanning tunneling spectroscopy: Comparison with scanning capacitance microscopy Liu FY, Griffin PB, Plummer JD, Lyding JW, Moran JM, Richards JF, Kulig L Journal of Vacuum Science & Technology B, 22(1), 422, 2004 |