검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Marbled texture of sputtered Al/Si alloy thin film on Si Gentile MG, Munoz-Tabares JA, Chiodoni A, Sgorlon C, Para I, Carta R, Richieri G, Bejtka K, Merlin L, Vittone E Thin Solid Films, 612, 165, 2016 |
| 2 |
Phase formation at rapid thermal annealing of nickel contacts on C-face n-type 4H-SiC. Ferrero S, Albonico A, Meotto UM, Rombola G, Porro S, Giorgis F, Perrone D, Scaltrito L, Bontempi E, Depero LE, Richieri G, Merlin L Materials Science Forum, 483, 733, 2005 |
| 3 |
Design, Fabrication, and Characterization of 1.5 M Omega cm(2), 800 V 4H-SiC n-type Schottky Barrier Diodes Furno M, Bonani F, Ghione G, Ferrero S, Porro S, Mandracci P, Scaltrito L, Perrone D, Richieri G, Merlin L Materials Science Forum, 483, 941, 2005 |
| 4 |
Plasma-assisted SiC oxidation for power device fabrication Mandracci P, Ferrero S, Porro S, Ricciardi C, Richieri G, Scaltrito L Applied Surface Science, 238(1-4), 336, 2004 |
| 5 |
Defect influence on the electrical properties of 4H-SiC Schottky diodes Scaltrito L, Celasco E, Porro S, Ferrero S, Giorgis F, Pirri CF, Perrone D, Meotto U, Mandracci P, Richieri G, Merlin L, Cavallini A, Castaldini A, Rossi M Materials Science Forum, 457-460, 1081, 2004 |
| 6 |
Low temperature growth of SiO2 on SiC by plasma enhanced chemical vapor deposition for power device applications Mandracci P, Ferrero S, Ricciardi C, Scaltrito L, Richieri G, Sgorlon C Thin Solid Films, 427(1-2), 142, 2003 |
| 7 |
Correlation between defects and electrical properties of 4H-SiC based Schottky diodes Scaltrito L, Porro S, Giorgis F, Mandracci P, Cocuzza M, Pirri CF, Ricciardi C, Ferrero S, Richieri G, Sgorlon C, Merlin L, Cavallini A, Castaldini A Materials Science Forum, 433-4, 455, 2002 |