| 1 |
Study of the influence of the rare-earth elements on the properties of lead iodide
Matuchova M, Zdansky K, Zavadil J, Danilewsky A, Riesz F, Hassan MAS, Alexiew D, Kral R
Journal of Crystal Growth, 311(14), 3557, 2009 |
| 2 |
Sub-pixel detection of a grid's node positions for optical diagnostics
Lukacs IE, Riesz F
Thin Solid Films, 516(22), 8082, 2008 |
| 3 |
Makyoh-topography study of the swirl defect in Si wafers
Riesz F, Pap AE, Adam M, Lukacs IE
Thin Solid Films, 516(22), 8087, 2008 |
| 4 |
Makyoh-topography studies of the morphology of the cross sections of renal stones
Riesz F, Pramatarova LD, Pramatarova R, Toth AL
Journal of Crystal Growth, 245(1-2), 101, 2002 |
| 5 |
The application of Makyoh topography for the study of GaAs layers grown by epitaxial lateral overgrowth
Riesz F, Zytkiewicz ZR
Journal of Crystal Growth, 222(4), 741, 2001 |
| 6 |
A quantitative approach to Makyoh (magic-mirror) topography
Riesz F
Journal of Crystal Growth, 210(1-3), 370, 2000 |
| 7 |
Selective electrochemical profiling of threading defects in mismatched heteroepitaxial systems
Nemcsics A, Riesz F, Dobos L
Thin Solid Films, 343-344, 520, 1999 |
| 8 |
Thermal decomposition of bulk and heteroepitaxial (100) InP surfaces : A combined in situ scanning electron microscopy and mass spectrometric study
Riesz F, Dobos L, Karanyi J
Journal of Vacuum Science & Technology B, 16(5), 2672, 1998 |
| 9 |
Crystallographic Tilting in High-Misfit (100) Semiconductor Heteroepitaxial Systems
Riesz F
Journal of Vacuum Science & Technology A, 14(2), 425, 1996 |
