화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 Tunable distributed-feedback laser gratings for telecom applications, manufactured by electron-beam lithography
Rishton SA, Pezeshki B, Zou S, Yoffe G, Henschel W
Journal of Vacuum Science & Technology B, 20(6), 2749, 2002
2 High-throughput electron-beam lithography with a raster-scanned, variably shaped beam
Veneklasen LH, Kao HM, Rishton SA, Winter S, Boegli V, Newman T, Bertuccelli G, Howard G, Le P, Tan Z, Lozes R
Journal of Vacuum Science & Technology B, 19(6), 2455, 2001
3 Raster shaped beam pattern generation
Rishton SA, Varner JK, Veneklasen LH, Boegli V, Sagle AL, Hofmann U, Kao H, Wang W
Journal of Vacuum Science & Technology B, 17(6), 2927, 1999
4 Atomic-Force Microscope-Based Data-Storage Using Replicated Media
Terris BD, Rishton SA, Mamin HJ, Best ME, Logan JA, Rugar D
Journal of Vacuum Science & Technology B, 15(4), 1584, 1997
5 New complimentary metal-oxide semiconductor technology with self-aligned Schottky source/drain and low-resistance T gates
Rishton SA, Ismail K, Chu JO, Chan KK, Lee KY
Journal of Vacuum Science & Technology B, 15(6), 2795, 1997
6 Electron-Beam Microcolumns for Lithography and Related Applications
Chang TH, Thomson MG, Kratschmer E, Kim HS, Yu ML, Lee KY, Rishton SA, Hussey BW, Zolgharnain S
Journal of Vacuum Science & Technology B, 14(6), 3774, 1996
7 Experimental Evaluation of a 20X20 mm Footprint Microcolumn
Kratschmer E, Kim HS, Thomson MG, Lee KY, Rishton SA, Yu ML, Zolgharnain S, Hussey BW, Chang TH
Journal of Vacuum Science & Technology B, 14(6), 3792, 1996
8 An Electron-Beam Microcolumn with Improved Resolution, Beam Current, and Stability
Kratschmer E, Kim HS, Thomson MG, Lee KY, Rishton SA, Yu ML, Chang TH
Journal of Vacuum Science & Technology B, 13(6), 2498, 1995
9 Characterization of a GaAs Metal-Semiconductor-Metal Low-Energy-Electron Detector
Zolgharnain S, Lee KY, Rishton SA, Kisker D, Chang TH
Journal of Vacuum Science & Technology B, 13(6), 2556, 1995
10 Micromachining Applications of a High-Resolution Ultrathick Photoresist
Lee KY, Labianca N, Rishton SA, Zolgharnain S, Gelorme JD, Shaw J, Chang TH
Journal of Vacuum Science & Technology B, 13(6), 3012, 1995