| 1 |
Absorption mechanisms of silicon nanocrystals in cosputtered silicon-rich-silicon oxide films
Podhorodecki A, Misiewiez J, Gourbilleau F, Rizk R
Electrochemical and Solid State Letters, 11(3), K31, 2008 |
| 2 |
Low-temperature processing and properties of nanocrystalline-SiC/crystalline Si heterojunction devices
Colder H, Rizk R, Pichon L, Bonnaud O
Solid-State Electronics, 50(2), 209, 2006 |
| 3 |
Evidence of energy transfer from Si agglomerates to Er ions in aluminosilicate glass thin layers
Gourbilleau F, Madelon R, Prassas M, Rizk R
Journal of Vacuum Science & Technology A, 23(5), 1354, 2005 |
| 4 |
Characterization of SiC thin film obtained by magnetron reactive sputtering : IBA, IR and Raman studies
Colder H, Morales M, Rizk R, Vickridge I
Materials Science Forum, 483, 287, 2005 |
| 5 |
Anisotropic crystallite size analysis of textured nanocrystalline silicon thin films probed by X-ray diffraction
Morales M, Leconte Y, Rizk R, Chateigner D
Thin Solid Films, 450(1), 216, 2004 |
| 6 |
Pronounced crystallization of silicon layers deposited with high deposition rates at temperatures <= 200 degrees C
Leconte Y, Marie P, Portier X, Lejeune M, Rizk R
Thin Solid Films, 427(1-2), 252, 2003 |
| 7 |
Spectroscopic ellipsometry analysis of nanocrystalline silicon carbide obtained at low temperature
Kerdiles S, Madelon R, Rizk R
Applied Surface Science, 184(1-4), 150, 2001 |
| 8 |
Structural, ellipsometry and photoluminescence spectroscopy studies of silicon nanograins embedded in a silica matrix
Charvet S, Madelon R, Rizk R
Solid-State Electronics, 45(8), 1505, 2001 |
| 9 |
Crystallization control of the amorphous buffer layer in hydrogenated nanocrystalline silicon
Gourbilleau F, Achiq A, Voivenel P, Rizk R
Thin Solid Films, 337(1-2), 74, 1999 |
| 10 |
Effects of hydrogen partial pressure on the structure and properties of sputtered silicon layers
Achiq A, Rizk R, Gourbilleau F, Voivenel P
Thin Solid Films, 348(1-2), 74, 1999 |
