검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
A ternary-3D analysis of the optical properties of amorphous hydrogenated silicon-rich carbide Summonte C, Gaspari F, Quaranta S, Rizzoli R, Centurioni E, Canino M, Polliotti AY, Bianconi M, Desalvo A Materials Chemistry and Physics, 221, 301, 2019 |
| 2 |
Local epitaxy from the silicon substrate in silicon-rich SiC during Si-nanocrystals formation Canino M, Balboni R, Desalvo A, Centurioni E, Rizzoli R, Bellettato M, Summonte C Thin Solid Films, 628, 54, 2017 |
| 3 |
Graphene-Epoxy Flexible Transparent Capacitor Obtained By Graphene-Polymer Transfer and UV-Induced Bonding Sangermano M, Chiolerio A, Veronese GP, Ortolani L, Rizzoli R, Mancarella F, Morandi V Macromolecular Rapid Communications, 35(3), 355, 2014 |
| 4 |
Carbon-Cap for Ohmic Contacts on Ion-Implanted 4H-SiC Nipoti R, Mancarella F, Moscatelli F, Rizzoli R, Zampolli S, Ferri M Electrochemical and Solid State Letters, 13(12), H432, 2010 |
| 5 |
Hydrocarbon molecules deposited onto monolayer steps on Si(100): A study of adsorption and conductance Mazzone AM, Rizzoli R Applied Surface Science, 253(10), 4537, 2007 |
| 6 |
An optimized texturing process for silicon solar cell substrates using TMAH Iencinella D, Centurioni E, Rizzoli R, Zignani F Solar Energy Materials and Solar Cells, 87(1-4), 725, 2005 |
| 7 |
Silicon heterojunction solar cells with p nanocrystalline thin emitter on monocrystalline substrate Zignani F, Desalvo A, Centurioni E, Iencinella D, Rizzoli R, Summonte C, Migliori A Thin Solid Films, 451-52, 350, 2004 |
| 8 |
Optimization of ITO layers for applications in a-Si/c-Si heterojunction solar cells Pla J, Tamasi M, Rizzoli R, Losurdo M, Centurioni E, Summonte C, Rubinelli F Thin Solid Films, 425(1-2), 185, 2003 |
| 9 |
Amorphous carbon deposited by pulsed laser ablation as material for cold cathode flat emitters Angelucci R, Rizzoli R, Salvatori S, Nicoletti S, Migliori A, Brugnoli E Applied Surface Science, 186(1-4), 423, 2002 |
| 10 |
Parametrization of optical properties of indium-tin-oxide thin films by spectroscopic ellipsometry: Substrate interfacial reactivity Losurdo M, Giangregorio M, Capezzuto P, Bruno G, De Rosa R, Roca F, Summonte C, Pla J, Rizzoli R Journal of Vacuum Science & Technology A, 20(1), 37, 2002 |