검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Threading dislocations in GaAs epitaxial layers on various thickness Ge buffers on 300 mm Si substrates Bogumilowicz Y, Hartmann JM, Rochat N, Salaun A, Martin M, Bassani F, Baron T, David S, Bao XY, Sanchez E Journal of Crystal Growth, 453, 180, 2016 |
| 2 |
Investigation of Al2O3 barrier film properties made by atomic layer deposition onto fluorescent tris-(8-hydroxyquinoline) aluminium molecular films Maindron T, Aventurier B, Ghazouani A, Jullien T, Rochat N, Simon JY, Viasnoff E Thin Solid Films, 548, 517, 2013 |
| 3 |
Comparative study of non-polar switching behaviors of NiO- and HfO2-based oxide resistive-RAMs Jousseaume V, Fantini A, Nodin JF, Guedj C, Persico A, Buckley J, Tirano S, Lorenzi P, Vignon R, Feldis H, Minoret S, Grampeix H, Roule A, Favier S, Martinez E, Calka P, Rochat N, Auvert G, Barnes JP, Gonon P, Vallee C, Perniola L, De Salvo B Solid-State Electronics, 58(1), 62, 2011 |
| 4 |
Germanium and Silicon: A Comparative Study of Hydrogenated Interstitial and Vacancy Defects by IR Spectroscopy Rochat N, Tauzin A, Mazen F, Clavelier L Electrochemical and Solid State Letters, 13(5), G40, 2010 |
| 5 |
Characteristics of atomic-layer-deposited thin HfxZr1-xO2 gate dielectrics Triyoso DH, Hegde RI, Schaeffer JK, Gregory R, Wang XD, Canonico M, Roan D, Hebert EA, Kim K, Jiang J, Rai R, Kaushik V, Samavedam SB, Rochat N Journal of Vacuum Science & Technology B, 25(3), 845, 2007 |
| 6 |
Investigation of hafnium-aluminate alloys in view of integration as interpoly dielectrics of future Flash memories Molas G, Bocquet M, Buckley J, Grampeix H, Gely M, Colonna JP, Licitra C, Rochat N, Veyront T, Garros X, Martin F, Brianceau P, Vidal V, Bongiorno C, Lombardo S, De Salvo B, Deleonibus S Solid-State Electronics, 51(11-12), 1540, 2007 |
| 7 |
Non uniformities of silicon oxide films grown in peroxide mixtures Bertagna V, Petitdidier S, Rochat N, Rouchon D, Besson P, Erre R, Chemla M Journal of Electroanalytical Chemistry, 584(1), 54, 2005 |
| 8 |
Growth mechanism and characterization of chemical oxide films produced in peroxide mixtures on Si(100) surfaces Petitdidier S, Bertagna V, Rochat N, Rouchon D, Besson P, Erre R, Chemla M Thin Solid Films, 476(1), 51, 2005 |
| 9 |
Etching of porous SiOCH materials in fluorocarbon-based plasmas Posseme N, Chevolleau T, Joubert O, Vallier L, Rochat N Journal of Vacuum Science & Technology B, 22(6), 2772, 2004 |
| 10 |
Interfacial strain and defects in Si (001) carbonisation layers for 3C-SiC hetero-epitaxy Bustarret E, Araujo D, Mendez D, Morales FM, Pacheco FJ, Molina SI, Rochat N, Ferro G, Monteil Y Materials Science Forum, 457-460, 277, 2004 |