검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
dc and low frequency noise analysis of Fowler-Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology Armand J, Martinez F, Benoit P, Valenza M, Vincent E, Huard V, Rochereau K Journal of Vacuum Science & Technology B, 27(3), 1129, 2009 |
| 2 |
Abnormally high local electrical fluctuations in heavily pocket-implanted bulk long MOSFET Cathignol A, Bordez S, Cros A, Rochereau K, Ghibaudo G Solid-State Electronics, 53(2), 127, 2009 |
| 3 |
High threshold voltage matching performance on gate-all-around MOSFET Cathignol A, Cros A, Harrison S, Cerrutti R, Coronel P, Pouydebasque A, Rochereau K, Skotnicki T, Ghibaudo G Solid-State Electronics, 51(11-12), 1450, 2007 |
| 4 |
65 nm LP/GP mix low cost platform for multi-media wireless and consumer applications Tavel B, Duriez B, Gwoziecki R, Basso MT, Julien C, Ortolland C, Laplanche Y, Fox R, Sabouret E, Detcheverry C, Boeuf F, Morin P, Barge D, Bidaud M, Bienacel J, Garnier P, Cooper K, Chapon JD, Trouiller Y, Belledent J, Broekaart M, Gouraud P, Denais M, Huard V, Rochereau K, Difrenza R, Planes N, Marin M, Boret S, Gloria D, Vanbergue S, Abramowitz P, Vishnubhotla L, Reber D, Stolk P, Woo M, Arnaud F Solid-State Electronics, 50(4), 573, 2006 |