검색결과 : 4건
No. | Article |
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1 |
Correlation between the residual stress and the density of threading dislocations in GaN layers grown by hydride vapor phase epitaxy Barchuk M, Roder C, Shashev Y, Lukin G, Motylenko M, Kortus J, Patzold O, Rafaja D Journal of Crystal Growth, 386, 1, 2014 |
2 |
Raman spectroscopic and X-ray diffraction investigations of epitaxial BiCrO3 thin films Talkenberger A, Himcinschi C, Weissbach T, Vijayanandhini K, Vrejoiu I, Roder C, Rafaja D, Kortus J Thin Solid Films, 520(14), 4590, 2012 |
3 |
N-face GaN nanorods: Continuous-flux MOVPE growth and morphological properties Bergbauer W, Strassburg M, Kolper C, Linder N, Roder C, Lahnemann J, Trampert A, Fundling S, Li SF, Wehmann HH, Waag A Journal of Crystal Growth, 315(1), 164, 2011 |
4 |
Optical characterization of InxGa1-xN alloys Gartner M, Kruse C, Modreanu M, Tausendfreund A, Roder C, Hommel D Applied Surface Science, 253(1), 254, 2006 |