검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
On the Reliability of Sodium Metal Anodes: The Influence of Neglected Parameters Rupp R, Vlad A Journal of the Electrochemical Society, 166(14), A3122, 2019 |
| 2 |
Influence of overgrown micropipes in the active area of SIC Schottky diodes on long term reliability Rupp R, Treu M, Turkes P, Beermann H, Scherg T, Preis H, Cerva H Materials Science Forum, 483, 925, 2005 |
| 3 |
Challenges and first results of SiC Schottky diode manufacturing using a 3 inch technology Treu M, Rupp R, Brunner H, Dahlquist F, Hecht C Materials Science Forum, 457-460, 981, 2004 |
| 4 |
Dean vortex membrane microfiltration and diafiltration of rBDNF E-coli inclusion bodies Schutyser M, Rupp R, Wideman J, Belfort G Biotechnology Progress, 18(2), 322, 2002 |
| 5 |
Surface properties and electrical characteristics of rapid thermal annealed 4H-SiC Bauer AJ, Rambach M, Frey L, Weiss R, Rupp R, Friedrichs P, Schorner R, Peters D Materials Science Forum, 433-4, 609, 2002 |
| 6 |
SiC power devices: How to be competitive towards Si-based solutions? Rupp R, Zverev I Materials Science Forum, 433-4, 805, 2002 |
| 7 |
The electrothermal behavior of 4H-SiC Schottky diodes at forward bias considering single pulse and pulsed current operation Felsl HP, Wachutka G, Rupp R Materials Science Forum, 433-4, 839, 2002 |
| 8 |
Temperature dependence of forward and reverse characteristics of Ti, W, Ta and Ni Schottky diodes on 4H-SiC Treu M, Rupp R, Kapels H, Bartsch W Materials Science Forum, 353-356, 679, 2001 |
| 9 |
Reliability and degradation of metal-oxide-semiconductor capacitors on 4H-and 6H-silicon carbide Treu M, Schorner R, Friedrichs P, Rupp R, Wiedenhofer A, Stephani D, Ryssel H Materials Science Forum, 338-3, 1089, 2000 |
| 10 |
Performance and reliability issues of SiC-Schottky diodes Rupp R, Treu M, Mauder A, Griebl E, Werner W, Bartsch W, Stephani D Materials Science Forum, 338-3, 1167, 2000 |