검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Roughness Analysis of Optical Films and Substrates by Atomic-Force Microscopy Ruppe C, Duparre A Thin Solid Films, 288(1-2), 8, 1996 |
| 2 |
Atomic-Force Microscopy on Cross-Sections of Optical Coatings - A New Method Duparre A, Ruppe C, Pischow KA, Adamik M, Barna PB Thin Solid Films, 261(1-2), 70, 1995 |