화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Lattice and grain-boundary diffusions of impurity atoms in BaSi2 epitaxial layers grown by molecular beam epitaxy
Nakamura K, Toh K, Baba M, Khan MA, Du W, Toko K, Suemasu T
Journal of Crystal Growth, 378, 189, 2013
2 Formation of large-grain-sized BaSi2 epitaxial layers grown on Si(111) by molecular beam epitaxy
Baba M, Toh K, Toko K, Hara KO, Usami N, Saito N, Yoshizawa N, Suemasu T
Journal of Crystal Growth, 378, 193, 2013
3 Large photoresponsivity in semiconducting BaSi2 epitaxial films grown on Si(001) substrates by molecular beam epitaxy
Koike S, Toh K, Baba M, Toko K, Hara KO, Usami N, Saito N, Yoshizawa N, Suemasu T
Journal of Crystal Growth, 378, 198, 2013
4 Molecular beam epitaxy of boron doped p-type BaSi2 epitaxial films on Si(111) substrates for thin-film solar cells
Khan MA, Hara KO, Nakamura K, Du WJ, Baba M, Toh K, Suzuno M, Toko K, Usami N, Suemasu T
Journal of Crystal Growth, 378, 201, 2013
5 Molecular beam epitaxy of band gap tunable ternary semiconducting silicides Ba1-xSrxSi2 for photovoltaic application
Suemasu T, Morita K, Kobayashi M
Journal of Crystal Growth, 301, 680, 2007
6 Semiconducting beta-FeSi2 towards optoelectronics and photonics
Maeda Y
Thin Solid Films, 515(22), 8118, 2007
7 Effect of thermal annealing on the photoluminescence of beta-FeSi2 films on Si substrate
Yamaguchi K, Shimura K, Udono H, Sasase M, Yamamoto H, Shamoto SI, Hojou K
Thin Solid Films, 508(1-2), 367, 2006
8 Electronic properties of semiconducting silicides: fundamentals and recent predictions
Ivanenko LI, Shaposhnikov VL, Filonov AB, Krivosheeva AV, Borisenka VE, Migas DB, Miglio L, Behr G, Schumann J
Thin Solid Films, 461(1), 141, 2004
9 Characterization of a beta-FeSi2 p-n junction formed by the PECS method
Uchitomi N, Nishino N, Mori A, Takeda M, Jinbo Y
Thin Solid Films, 461(1), 174, 2004
10 Ion beam synthesized silicides: growth, characterization and devices
Homewood KP, Reeson KJ, Gwilliam RM, Kewell AK, Lourenco MA, Shao G, Chen YL, Sharpe JS, McKinty CN, Butler T
Thin Solid Films, 381(2), 188, 2001