| 1 |
Depth profiling of cells and tissues by using C-60(+) and SF5+ as sputter ions
Malmberg P, Kriegeskotte C, Arlinghaus HF, Hagenhoff B, Holmgren J, Nilsson M, Nygren H
Applied Surface Science, 255(4), 926, 2008 |
| 2 |
The cytochemistry of anaplastic thyroid tumour cells and differentiated thyrocytes analyzed by TOF-SIMS and depth profiling
Nygren H, Malmberg P, Nilsson M, Kriegeskotte C, Arlinghaus HF
Applied Surface Science, 255(4), 1285, 2008 |
| 3 |
Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
Mahoney CM, Fahey AJ, Gillen G, Xu C, Batteas JD
Applied Surface Science, 252(19), 6502, 2006 |
| 4 |
Characterization and ion-induced degradation of cross-linked poly(methyl methacrylate) studied using time of flight secondary ion mass spectrometry
Wagner MS, Lenghaus K, Gillen G, Tarlov MJ
Applied Surface Science, 253(5), 2603, 2006 |
| 5 |
Positive secondary ion yield enhancement of metal elements using trichlorotrifluoroethane and tetrachloroethene backfilling
Chi PH, Gillen G
Applied Surface Science, 231-2, 127, 2004 |
| 6 |
Impact energy dependence of SF5+ ion beam damage of poly(methyl methacrylate) studied by time-of-flight secondary ion mass spectrometry
Wagner MS, Gillen G
Applied Surface Science, 231-2, 169, 2004 |
| 7 |
Dynamic SIMS utilizing SF5+ polyatomic primary ion beams for drug delivery applications
Mahoney CM, Roberson S, Gillen G
Applied Surface Science, 231-2, 174, 2004 |
| 8 |
A High-Resolution Energy-Selected Kinetic-Energy Release Study of the Process Sf6+h-Nu-)Sf+(5)+f+e(-) - Heat of Formation of Sf+(5)
Evans M, Ng CY, Hsu CW, Heimann P
Journal of Chemical Physics, 106(3), 978, 1997 |
