| 1 |
On the sensitivity of convergent beam low energy electron diffraction patterns to small atomic displacements
Constantinou PC, Jesson DE
Applied Surface Science, 489, 504, 2019 |
| 2 |
Influence of hydrogen intercalation on graphene/Ge(001)/Si(001) interface
Grzonka J, Pasternak I, Michalowski PP, Kolkovsky V, Strupinski W
Applied Surface Science, 447, 582, 2018 |
| 3 |
Structure properties and electrical mechanisms of Si(001)/SiO2 interface with varying Si layer thickness in nano-scale transistor
Li H, Ji A, Zhu C, Mao LF
Current Applied Physics, 18(9), 1020, 2018 |
| 4 |
Structure properties and electrical mechanisms of Si(001)/SiO2 interface with varying Si layer thickness in nano-scale transistor
Li H, Ji A, Zhu C, Mao LF
Current Applied Physics, 18(9), 1020, 2018 |
| 5 |
Optical anisotropy of quasi-1D rare-earth suicide nanostructures on Si(001)
Chandola S, Speiser E, Esser N, Appelfeller S, Franz M, Dahne M
Applied Surface Science, 399, 648, 2017 |
| 6 |
Improved crystal quality of semipolar (10(1)over-bar3) GaN on Si(001) substrates using AlN/GaN superlattice interlayer
Lee HJ, Bae SY, Lekhal K, Mitsunari T, Tamura A, Honda Y, Amano H
Journal of Crystal Growth, 454, 114, 2016 |
| 7 |
The influence of instrumental parameters on the adhesion force in a flat-on-rough contact geometry
Colak A, Wormeester H, Zandvliet HJW, Poelsema B
Applied Surface Science, 353, 1285, 2015 |
| 8 |
Atomic scale fabrication of dangling bond structures on hydrogen passiyated Si(001) wafers processed and nanopackaged in a clean room environment
Kolmer M, Godlewski S, Zuzak R, Wojtaszek M, Rauer C, Thuaire A, Hartmann JM, Moriceau H, Joachim C, Szymonski M
Applied Surface Science, 288, 83, 2014 |
| 9 |
Influence of C-defect at Si(001) surface on the adsorption of Al, Ag and Pb atoms
Pieczyrak B, Jurczyszyn L
Applied Surface Science, 304, 91, 2014 |
| 10 |
The influence of instrumental parameters on the adhesion force in a flat-on-flat contact geometry
Colak A, Wormeester H, Zandvliet HJW, Poelsema B
Applied Surface Science, 308, 106, 2014 |
