검색결과 : 3건
No. | Article |
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1 |
Visualization of oxide ionic diffusion at SOFC cathode/electrolyte interfaces by isotope labeling techniques Horita T, Nishi M, Shimonosono T, Kishimoto H, Yamaji K, Brito ME, Yokokawa H Solid State Ionics, 262, 398, 2014 |
2 |
Effect of primary oxygen ion implantation on SIMS depth profiling in glasses Tuleta M Applied Surface Science, 252(18), 6107, 2006 |
3 |
Characterization of polymer solar cells by TOF-SIMS depth profiling Bulle-Lieuwma CWT, van Gennip WJH, van Duren JKJ, Jonkheijm P, Janssen RAJ, Niemantsverdriet JW Applied Surface Science, 203, 547, 2003 |