화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Visualization of oxide ionic diffusion at SOFC cathode/electrolyte interfaces by isotope labeling techniques
Horita T, Nishi M, Shimonosono T, Kishimoto H, Yamaji K, Brito ME, Yokokawa H
Solid State Ionics, 262, 398, 2014
2 Effect of primary oxygen ion implantation on SIMS depth profiling in glasses
Tuleta M
Applied Surface Science, 252(18), 6107, 2006
3 Characterization of polymer solar cells by TOF-SIMS depth profiling
Bulle-Lieuwma CWT, van Gennip WJH, van Duren JKJ, Jonkheijm P, Janssen RAJ, Niemantsverdriet JW
Applied Surface Science, 203, 547, 2003