검색결과 : 33건
| No. | Article |
|---|---|
| 1 |
ToF-SIMS depth profiling of nanoparticles: Chemical structure of core-shell quantum dots Gulin A, Shakhov A, Vasin A, Astafiev A, Antonova O, Kochev S, Kabachii Y, Golub A, Nadtochenko V Applied Surface Science, 481, 144, 2019 |
| 2 |
Investigation of anodic TiO2 nanotube composition with high spatial resolution AES and ToF SIMS Dronov A, Gavrilin I, Kirilenko E, Dronova D, Gavrilov S Applied Surface Science, 434, 148, 2018 |
| 3 |
Reconstruction of GaAs/AlAs supperlattice multilayer structure by quantification of AES and SIMS sputter depth profiles Kang HL, Lao JB, Li ZP, Yao WQ, Liu C, Wang JY Applied Surface Science, 388, 584, 2016 |
| 4 |
An O-2(+) probe energy study for boron quantification in Si1-xGex (0 <= x <= 1) using secondary ion mass spectrometry Morris RJH Applied Surface Science, 390, 778, 2016 |
| 5 |
Recovery of SIMS depth profiles with account for nonstationary effects Yunin PA, Drozdov YN, Drozdov MN, Yurasova DV Applied Surface Science, 307, 33, 2014 |
| 6 |
Oxygen surface exchange and diffusion studies of La2Mo2O9 in different exchange atmospheres Liu J, Chater RJ, Morris RJH, Skinner SJ Solid State Ionics, 189(1), 39, 2011 |
| 7 |
Oxidation and diffusion study on AlCrVN hard coatings using oxygen isotopes O-16 and O-18 Franz R, Schnoller J, Hutter H, Mitterer C Thin Solid Films, 519(12), 3974, 2011 |
| 8 |
On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O-2(+) depth profiling Krivec S, Detzel T, Buchmayr M, Hutter H Applied Surface Science, 257(1), 25, 2010 |
| 9 |
Effect of annealing on the properties of N-doped ZnO films deposited by RF magnetron sputtering Wang JZ, Elamurugu E, Sallet V, Jomard F, Lusson A, do Rego AMB, Barquinha P, Goncalves G, Martins R, Fortunato E Applied Surface Science, 254(22), 7178, 2008 |
| 10 |
Cluster SIMS using metal cluster complex ions Fujiwara Y, Kondou K, Teranishi Y, Watanabe K, Nonaka H, Saito N, Itoh H, Fujimoto T, Kurokawa A, Ichimura S, Tomita M Applied Surface Science, 255(4), 916, 2008 |