검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Ultrathin N2O-Oxide with Atomically Flat Interfaces Chin A, Chen WJ, Lin BC, Kao JH, Tsai C, Huang JC Journal of the Electrochemical Society, 144(5), L97, 1997 |
| 2 |
The Evolution of (001)Si/SiO2 Interface Roughness During Thermal-Oxidation Fang SJ, Chen W, Yamanaka T, Helms CR Journal of the Electrochemical Society, 144(8), 2886, 1997 |