| 1 |
Finite element modeling of resistive surface layers by micro-contact impedance spectroscopy
Veazey RA, Gandy AS, Sinclair DC, Dean JS
Journal of the American Ceramic Society, 103(4), 2702, 2020 |
| 2 |
Modeling the influence of two terminal electrode contact geometry and sample dimensions in electro-materials
Veazey RA, Gandy AS, Sinclair DC, Dean JS
Journal of the American Ceramic Society, 102(6), 3609, 2019 |
| 3 |
Nanoscale electrical resistance imaging of solid electrolyte interphases in lithium-ion battery anodes
Kim SH, Kim YS, Baek WJ, Heo S, Han S, Jung H
Journal of Power Sources, 407, 1, 2018 |
| 4 |
Chemical-Assisted Mechanical Lapping of Thin Boron-Doped Diamond Films: A Fast Route Toward High Electrochemical Performance for Sensing Devices
Ryl J, Zielinski A, Burczyk L, Bogdanowicz R, Ossowski T, Darowicki K
Electrochimica Acta, 242, 268, 2017 |
| 5 |
Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy
Jiang CS, Repins IL, Beall C, Moutinho HR, Ramanathan K, Al-Jassim MM
Solar Energy Materials and Solar Cells, 132, 342, 2015 |
| 6 |
Experimental and analytical study on chip hot spot temperature
Byon C, Choo K, Kim SJ
International Journal of Heat and Mass Transfer, 54(9-10), 2066, 2011 |
| 7 |
Quantitative nanoscopic impedance measurements on silver-ion conducting glasses using atomic force microscopy combined with impedance spectroscopy
Kruempelmann J, Balabajew M, Gellert M, Roling B
Solid State Ionics, 198(1), 16, 2011 |
| 8 |
Mesoscopic impedance analysis of solid materials' surface
Darowicki K, Zielinski A
Electrochimica Acta, 55(26), 7761, 2010 |
| 9 |
Characterization of Arsenic segregation at Si/SiO2 interface by 3D atom probe tomography
Ngamo M, Duguay S, Pichler P, Daoud K, Pareige P
Thin Solid Films, 518(9), 2402, 2010 |
| 10 |
Improved determination of phosphorus contamination during ion implantation by SRP and simulations
Kuruc M, Hulenyi L, Kinder R
Applied Surface Science, 255(18), 8110, 2009 |
