화학공학소재연구정보센터
검색결과 : 7건
No. Article
1 2/3 in. ultrahigh-sensitivity image sensor with active-matrix high-efficiency electron emission device
Nakada T, Sato T, Matsuba Y, Sakemura K, Okuda Y, Negishi N, Watanabe A, Yoshikawa T, Ogasawara K, Nanba M, Tanioka K, Egami N, Kobayashi A, Koshida N
Journal of Vacuum Science & Technology B, 28(2), C2D11, 2010
2 Enhanced output current density of an active-matrix high-efficiency electron emission device array with 13.75 mu m pixels
Nakada T, Sato T, Matsuba Y, Tanaka R, Sakemura K, Negishi N, Okuda Y, Watanabe A, Yoshikawa T, Ogasawara K, Nanba M, Tanioka K, Egami N, Koshida N
Journal of Vacuum Science & Technology B, 27(2), 735, 2009
3 Development of a super-high-sensitivity image sensor using 640x480 pixel active-matrix high-efficiency electron emission device
Negishi N, Sato T, Matsuba Y, Tanaka R, Nakada T, Sakemura K, Okuda Y, Watanabe A, Yoshikawa T, Ogasawara K, Nanba M, Okazaki S, Tanioka K, Egami N, Koshida N
Journal of Vacuum Science & Technology B, 26(2), 711, 2008
4 Development of a high-resolution active-matrix electron emitter array for application to high-sensitivity image sensing
Negishi N, Matsuba Y, Tanaka R, Nakada T, Sakemura K, Okuda Y, Watanabe A, Yoshikawa T, Ogasawara K, Nanba M, Okazaki S, Tanioka K, Egami N, Koshida N
Journal of Vacuum Science & Technology B, 25(2), 661, 2007
5 Fabrication of active-matrix high-efficiency electron emission device and its application to high-sensitivity image sensing
Negishi N, Tanaka R, Nakada T, Sakemura K, Okuda Y, Satoh H, Watanabe A, Yoshikawa T, Ogasawara K, Nanba M, Okazaki S, Tanioka K, Egami N, Koshida N
Journal of Vacuum Science & Technology B, 24(2), 1021, 2006
6 Characterization of an advanced high-efficiency electron emission device
Negishi N, Nakada T, Sakemura K, Okuda Y, Satoh H, Watanabe A, Yoshikawa T, Ogasawara K, Koshida N
Journal of Vacuum Science & Technology B, 23(2), 682, 2005
7 Development of an advanced high efficiency electro-emission device
Sakemura K, Negishi N, Yamada T, Satoh H, Watanabe A, Yoshikawa T, Ogasawara K, Koshida N
Journal of Vacuum Science & Technology B, 22(3), 1367, 2004