화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Investigations of the Anodic Porous Etching of n-InP in HCl by Atomic Absorption and X-ray Photoelectron Spectroscopies
Santinacci L, Bouttemy M, Petit M, Goncalves AM, Simon N, Vigneron J, Etcheberry A
Journal of the Electrochemical Society, 165(4), H3131, 2018
2 The Electrochemical Behavior of SnSb as an Anode for Li-ion Batteries Studied by Electrochemical Impedance Spectroscopy and Electron Microscopy
Tesfaye AT, Yucel YD, Barr MKS, Santinacci L, Vacandio F, Dumur F, Maria S, Monconduit L, Djenizian T
Electrochimica Acta, 256, 155, 2017
3 Engineering a three-dimensional, photoelectrochemically active p-NiO/i-Sb2S3 junction by atomic layer deposition
Barr MKS, Assaud L, Wu YL, Laffon C, Parent P, Bachmann J, Santinacci L
Electrochimica Acta, 179, 504, 2015
4 A Novel Self-Ordered Sub-10 nm Nanopore Template for Nanotechnology
Moyen E, Santinacci L, Masson L, Wulfhekel W, Hanbucken M
Advanced Materials, 24(37), 5094, 2012
5 Electrochemical and optical characterizations of anodic porous n-InP(100) layers
Santinacci L, Goncalves AM, Simon N, Etcheberry A
Electrochimica Acta, 56(2), 878, 2010
6 Pore formation on n-InP(100) in acidic liquid ammonia at 223 K - A true water-free etching process
Goncalves AM, Santinacci L, Eb A, Gerard I, Mathieu C, Etcheberry A
Electrochemical and Solid State Letters, 10(4), D35, 2007
7 Defect-free AFM scratching at the Si/SiO2 interface used for selective electrodeposition of nanowires
Michler J, Gassilloud R, Gasser P, Santinacci L, Schmuki P
Electrochemical and Solid State Letters, 7(3), A41, 2004
8 Factors in electrochemical nanostructure fabrication using electron-beam induced carbon masking
Djenizian T, Santinacci L, Schmuki P
Journal of the Electrochemical Society, 151(3), G175, 2004
9 Lithium metal batteries operating at room temperature based on different PEO-PVdF separator configurations
Sannier L, Bouchet R, Santinacci L, Grugeon S, Tarascon JM
Journal of the Electrochemical Society, 151(6), A873, 2004
10 Selective palladium electrochemical deposition onto AFM-scratched silicon surfaces
Santinacci L, Djenizian T, Hildebrand H, Ecoffey S, Mokdad H, Campanella T, Schmuki P
Electrochimica Acta, 48(20-22), 3123, 2003