검색결과 : 2건
No. | Article |
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1 |
Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy Linder M, Hocker T, Holzer L, Friedrich KA, Iwanschitz B, Mai A, Schuler JA Journal of Power Sources, 272, 595, 2014 |
2 |
Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation Linder M, Hocker T, Holzer L, Friedrich KA, Iwanschitz B, Mai A, Schuler JA Journal of Power Sources, 243, 508, 2013 |