화학공학소재연구정보센터
검색결과 : 28건
No. Article
1 Plasma etch fabrication of 60:1 aspect ratio silicon nanogratings with 200 nm pitch
Mukherjee P, Bruccoleri A, Heilmann RK, Schattenburg ML, Kaplan AF, Guo LJ
Journal of Vacuum Science & Technology B, 28(6), C6P70, 2010
2 Spatial-frequency multiplication with multilevel interference lithography
Chang CH, Zhao Y, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 26(6), 2135, 2008
3 Fabrication of 200 nm period blazed transmission gratings on silicon-on-insulator wafers
Ahn M, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 26(6), 2179, 2008
4 Phase control in multiexposure spatial frequency multiplication
Zhao Y, Chang CH, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 25(6), 2439, 2007
5 Fabrication of ultrahigh aspect ratio freestanding gratings on silicon-on-insulator wafers
Ahn M, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 25(6), 2593, 2007
6 Doppler writing and linewidth control for scanning beam interference lithography
Montoya JC, Chang CH, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 23(6), 2640, 2005
7 High fidelity blazed grating replication using nanoimprint lithography
Chang CH, Montoya JC, Akilian M, Lapsa A, Heilmann RK, Schattenburg ML, Li M, Flanagan KA, Rasmussen AP, Seely JF, Laming JM, Kjornrattanawanich B, Goray LI
Journal of Vacuum Science & Technology B, 22(6), 3260, 2004
8 An international journal devoted to Microelectronics and Nanometer Structures - Processing, measurement, and phenomena - Preface
Schattenburg ML
Journal of Vacuum Science & Technology B, 21(6), 2623, 2003
9 Precision microcomb design and fabrication for x-ray optics assembly
Sun YX, Heilmann RK, Chen CG, Forest CR, Schattenburg ML
Journal of Vacuum Science & Technology B, 21(6), 2970, 2003
10 Nanometer-level repeatable metrology using the nanoruler
Konkola PT, Chen CG, Heilmann RK, Joo CM, Montoya JC, Chang CH, Schattenburg ML
Journal of Vacuum Science & Technology B, 21(6), 3097, 2003