화학공학소재연구정보센터
검색결과 : 22건
No. Article
1 Revisiting the cold case of cold fusion
Berlinguette CP, Chiang YM, Munday JN, Schenkel T, Fork DK, Koningstein R, Trevithick MD
Nature, 570(7759), 45, 2019
2 All-electric control of donor nuclear spin qubits in silicon
Sigillito AJ, Tyryshkin AM, Schenkel T, Houck AA, Lyon SA
Nature Nanotechnology, 12(10), 958, 2017
3 Controlling spin relaxation with a cavity
Bienfait A, Pla JJ, Kubo Y, Zhou X, Stern M, Lo CC, Weis CD, Schenkel T, Vion D, Esteve D, Morton JJL, Bertet P
Nature, 531(7592), 74, 2016
4 Reaching the quantum limit of sensitivity in electron spin resonance
Bienfait A, Pla JJ, Kubo Y, Stern M, Zhou X, Lo CC, Weis CD, Schenkel T, Thewalt MLW, Vion D, Esteve D, Julsgaard B, Molmer K, Morton JJL, Bertet P
Nature Nanotechnology, 11(3), 253, 2016
5 Effects of palladium coating on field-emission properties of carbon nanofibers in a hydrogen plasma
Waldmann O, Persaud A, Kapadia R, Takei K, Allen FI, Javey A, Schenkel T
Thin Solid Films, 534, 488, 2013
6 Electron spin coherence exceeding seconds in high-purity silicon
Tyryshkin AM, Tojo S, Morton JJL, Riemann H, Abrosimov NV, Becker P, Pohl HJ, Schenkel T, Thewalt MLW, Itoh KM, Lyon SA
Nature Materials, 11(2), 143, 2012
7 Single atom doping for quantum device development in diamond and silicon
Weis CD, Schuh A, Batra A, Persaud A, Rangelow IW, Bokor J, Lo CC, Cabrini S, Sideras-Haddad E, Fuchs GD, Hanson R, Awschalom DD, Schenkel T
Journal of Vacuum Science & Technology B, 26(6), 2596, 2008
8 Micromachined piezoresistive proximal probe with integrated bimorph actuator for aligned single ion implantation
Persaud A, Ivanova K, Sarov Y, Ivanov T, Volland BE, Rangelow IW, Nikolov N, Schenkel T, Djakov V, Jenkins DWK, Meijer J, Vogel T
Journal of Vacuum Science & Technology B, 24(6), 3148, 2006
9 Ion implantation with scanning probe alignment
Persaud A, Liddle JA, Schenkel T, Bokor J, Ivanov T, Rangelow IW
Journal of Vacuum Science & Technology B, 23(6), 2798, 2005
10 Semiconductor physics - Reliable performance
Schenkel T
Nature Materials, 4(11), 799, 2005