검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
Effective properties of a thermoelectric composite containing an elliptic inhomogeneity Song K, Song HP, Li M, Schiavone P, Gao CF International Journal of Heat and Mass Transfer, 135, 1319, 2019 |
| 2 |
A model for carbon nanotube-DNA hybrid using one-dimensional density of states Malysheva O, Tang T, Schiavone P Journal of Colloid and Interface Science, 380, 25, 2012 |
| 3 |
Binding Force Between a Charged Wall and a Complex Formed by a Polyelectrolyte and an Electronically Responsive Cylinder Malysheva O, Tang TA, Schiavone P Journal of Adhesion, 87(3), 251, 2011 |
| 4 |
Application of scatterometric porosimetry to characterize porous ultra low-k patterned layers Licitra C, Bouyssou R, El Kodadi M, Haberfehlner G, Chevolleau T, Hazart J, Virot L, Besacier M, Schiavone P, Bertin F Thin Solid Films, 519(9), 2825, 2011 |
| 5 |
Scatterometric porosimetry: A new characterization technique for porous material patterned structures Bouyssou R, El Kodadi M, Licitra C, Chevolleau T, Besacier M, Posseme N, Joubert O, Schiavone P Journal of Vacuum Science & Technology B, 28(4), L31, 2010 |
| 6 |
Real time scatterometry for profile control during resist trimming process El Kodadi M, Soulan S, Besacier M, Schiavone P Journal of Vacuum Science & Technology B, 27(6), 3232, 2009 |
| 7 |
Adhesion between a charged particle in an electrolyte solution and a charged substrate: Electrostatic and van der Waals interactions Malysheva O, Tang T, Schiavone P Journal of Colloid and Interface Science, 327(1), 251, 2008 |
| 8 |
Hyper high numerical aperature achromatic interferometer for immersion lithography at 193 nm Charley AL, Lagrange A, Lartigue O, Simon J, Thony P, Schiavone P Journal of Vacuum Science & Technology B, 23(6), 2668, 2005 |
| 9 |
Printability of nonsmoothed buried defects in extreme ultraviolet lithography mask blanks Farys V, Charpin-Nicolle C, Richard M, Robic JY, Muffato V, Quesnel E, Postnikov S, Schiavone P, Besacier M, Smaali R, Naulleau P Journal of Vacuum Science & Technology B, 23(6), 2860, 2005 |
| 10 |
Measurement of residual thickness using scatterometry Fuard D, Perret C, Farys V, Gourgon C, Schiavone P Journal of Vacuum Science & Technology B, 23(6), 3069, 2005 |